R&S FE170 D band frontend extensions enable sub-THz research  

At EuMW (European Microwave Week) Rohde & Schwarz will present a signal generation and analyser for measurements in the D band that, the company said will “significantly simplify early next generation mobile communications research”.

The The R&S FE170ST (single transmit) and R&S FE170SR (single receive) front end extensions are easy to mount to, and configure with, the R&S SMW200A vector signal generator and the R&S FSW signal and spectrum analyser. The extensions will allow these two instruments to cover frequency ranges between 110 and 170GHz which are key spectrum for beyond 5G, for 6G technology and for future automotive radar applications, pointed out the company.

A test set up for sub-THz research using the R&S SMW200A and R&S FSW can be configured using just three connections (IF, reference frequency and LAN) to integrate the front ends into the base units. All users have to do is enter the IP address in the user interface of the base units. After connection, the front ends are directly controlled by the R&S SMW200A and R&S FSW, because the front ends’ control unit is integrated in their firmware. 

The front ends are compact with a form factor of 152 x 190 x 50mm. In addition, the internal synthesiser provides a local oscillator (LO) so the test set up does not need an additional analogue signal source for “excellent phase noise performance”. 

Rohde & Schwarz also offers smart accessories such as bandpass filters and TX power amplifiers.

The R&S FE170ST and R&S FE170SR frontend solution for D band research will be available by the end of 2022. 

Rohde  & Schwarz is exhibiting at EuMW 2022 (27 to 29 September) at the Milano Convention Centre, Italy, stand number D18.

https://www.rohde-schwarz.com

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224G Ethernet test suite validates digital interface technology

At this week’s ECOC (European Conference on Optical Communication) in Basel, Switzerland, Keysight and Synopsys demonstrated the industry’s first common electrical interface (CEI) SoC supporting 224Gbits per second.

To accelerate 1.6Tbit per second transceiver designs and pathfinding, Keysight Technologies has introduced 224G Ethernet test products which enable SoC makers to validate next-generation electrical interface technology, said the company, accelerating 1.6Tbit per second transceiver design and pathfinding.

In response to the bandwidth demands in networks and data centres generated b y 5G, AI and IoT, there is a requirement for high speed digital interfaces that support 224Gbits per second, per lane data connection speeds for increased bandwidths and to underpin 1.6Tbit per second interconnect technology, said Keysight. Improved data throughput and efficiency in data centre networks also contribute to reductions in power consumption and cost. Keysight believes it is the only provider of bit error ratio testers (BERTs) capable of generating and analysing 224Gbit per second signals.

This portfolio includes the M8050A BERT, offering 224Gbit per second testing for electrical design and validation of transceiver SoCs used in data centres and networks for transferring large amounts of data at high speeds. It provides signal integrity that enables accurate characterisation of receivers used in next-generation data centre networks and server interfaces, said Keysight. 

Synopsys used the M8050A BERT, M8199 arbitrary waveform generator (AWG) and Infiniium UXR-series oscilloscope to develop and validate 224G serialiser / deserialiser (SerDes) IP designs.

“High-performance computing systems depend on high-speed, low-latency interfaces to process massive amounts of data with minimal power,” said John Koeter, senior vice president of marketing and strategy for the Solutions Group at Synopsys. The high speed Ethernet IP provided used Keysight’s digital interface test to validate the performance of the PHY IP. As a result, designers could meet their design and system-level requirements for high-performance computing, networking and AI SoCs, said Koeter.

http://www.keysight.com

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Basler uses Nvidia Jetson Orin Nano SoMs for entry level AI

Add-on camera kits announced by Basler at the Nvidia GTC conference this week, support the Nvidia Jetson Orin Nano system on modules (SoMs). These SoMs have set a new baseline for entry-level edge AI and robotics, said Basler. The five and 13Mpixel camera kits are ready to use vision extensions that include an adapter board, camera, lens and cables. 

The Basler Camera Enablement software package enables smooth integration of Basler’s Camera Software pylon with the Nvidia JetPack software development kit. A Camera Enablement package includes a Basler camera kernel driver, device-tree overlays for the supported boards, GenTL Producer and the pylon Viewer application. The camera kits are claimed to offer the most cost-effective prototyping approach and are suitable for mass production.

The camera kits are scheduled to be available from the beginning of 2023. Basler explained that customers can develop edge AI, robotics, AIoT (AI of things) and embedded solutions on the Nvidia Jetson AGX Orin developer kit and then deploy and scale applications on the AGX Orin production modules. When the Orin Nano and Orin NX modules become available they will also be compatible. 

“Our portfolio ranges from different cameras and products to complement vision applications to the Pylon software framework for AI-based image processing solutions,” said Malene Fricke, head of module business at Basler.

“The upcoming Nvidia Orin Nano SoMs are an ideal processing platform to develop advanced edge AI vision systems for . . . customers focusing on automation applications in smart factories, the medical and life sciences market, robotics and logistics use cases, as well as intelligent traffic systems,” she added. 

Basler manufactures imaging components for computer vision applications. In addition to classic area scan and line scan cameras, lenses, frame grabbers, light modules, 3D products, and software, the company offers embedded vision products, consulting services, customer specific software development as well as customised products. 

The company’s products are used in a variety of markets and applications, including factory automation, medical, logistics, retail, and robotics. 

Founded in 1988, the Basler Group employs around 1,000 people at its headquarters in Ahrensburg, Germany and other locations in Europe, Asia, and North America. 

http://www.baslerweb.com

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Automated test and validation accelerates measurements in high speed devices

Engineers can test PCIe 6.0 (Base) receivers using the PCIe 6.0 receiver test option developed by Tektronix in collaboration with Anritsu. 

The PCIe 6.0 (64GTransfers per second) automated test runs on the Tektronix DPO70000SX series real time oscilloscope and the Anritsu MP1900A BERT. 

The automated test and validation option is claimed to render faster test times, and has an intuitive user interface.     

The cohesive PCIe 6.0 transmitter and receiver test presents the ability to test increasing amounts of data as it is transferred at increasing speeds. Data-intensive sectors, like AI, cloud, and data centres use PCIe as a de-facto standard, explained Tektronix. While the recently released Gen 6.0 standard provides fast speeds to handle such workloads, testing brings challenges to those charged with integrating PCIe 6.0 on devices. 

PCIe receiver validation is plagued by the sensitivity of calibrating the stressed eye signal across a high loss channel. Tektronix’s PCIe receiver test targets the required bit error rate (BER) while intuitive step-by-step tools provide link training routines for the Anritsu MP1900A BERT to ensure the receiver is tested accurately. 

The Tektronix PCIe 6.0 Base Rx solution includes what is claimed to be the fastest 64GTransfers per second (PAM4) Rx calibration in the industry. Novel algorithms calibrate the transmitter’s additional pre-cursor added to the 6.0 Base specification. 

The Tektronix PAMJET DSP tool provides critical 64GTransfers per second jitter and noise measurements with instrument noise compensation. Tektronix said that the automated test leverages the market’s first 6.0 Base Tx solution and enhances the capabilities to address receiver challenges at the latest data rate introduced by the PCI Special Interest Group (PCI-SIG).

The TekRxTest automation software provides a single control panel with the power to manage a Tektronix oscilloscope and Anritsu BERT during receiver calibration. This intuitive software wizard guides users through short- and long-channel calibration steps with ease, resulting in an accurate and repeatable calibration at 64 GTransfers per second.

Integrating the Anritsu MP1900A and Tektronix DPO70000SX real time oscilloscopes deliver a complete physical layer PCIe test system that can be expanded to PCIe 6.0 as the market continues to develop technologies for high-speed networks, said Kazuhiro Fujinuma, director of solution marketing department service infrastructure division for Anritsu.

Synopsys also collaborated with Tektronix on early validation of the PCIe 6.0 DesignWare IP, providing early-stage prototypes for Tektronix’s partnership with Anritsu. 

“The PCIe 6.0 interface is instrumental to enabling real-time data connectivity with low latency and high throughput in HPC [high performance computing], storage, and AI applications,” said John Koeter, senior vice president of marketing and strategy for IP at Synopsys. “Conducting early, accurate and efficient validation of the Synopsys silicon-proven PCIe 6.0 IP . . . demonstrates that the IP adheres to the latest PCI-SIG specifications, enabling designers to deliver interoperable products that include Synopsys PCIe 6.0 controller, PHY, verification, and integrity and data encryption (IDE) IP faster and with less risk.”

Tektronix’s PCIe 6.0 receiver test is available now worldwide for use with DPO70000SX real time oscilloscopes. 

http://www.Tek.com

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