Analog Devices’ MEMS accelerometers monitor industry
Analog Devices has announced two, high frequency, low noise MEMS accelerometers designed specifically for industrial condition monitoring applications.
The ADXL1001 and ADXL1002 MEMS accelerometers deliver the high resolution vibration measurements necessary for early detection of bearing faults and other common causes of machine failure, says Analog Devices. Historically, inadequate noise performance of available high frequency MEMS accelerometers compared with legacy technology held back adoption, failing to take advantage of MEMS reliability, quality and repeatability. Analog Devices reports that the ADXL1001 and ADXL1002 noise performance over high frequencies is on par with available PZT technology. The MEMS accelerometers are particularly suitable for new condition monitoring products. The ADXL1001 and ADXL1002 from Analog Devices, provide accurate data for smart factory Internet of Things (IoT) applications, and enabling intelligent sensing from the edge of the network.
The ADXL1001 and ADXL1002 MEMS accelerometers deliver ultra-low noise density over an extended bandwidth with high-g range. The accelerometers are available in two models with full-scale ranges of ±100g (ADXL1001) and ±50g (ADXL1002). Typical noise density for the ADXL1002 is 25 μg/Hz, with a sensitivity of 40mV/g, and 30 μg/Hz for ADXL1001 with sensitivity 20mV/g. Both accelerometers operate on single voltage supply from 3.0 to 5.25V, and offer useful features such as complete, electrostatic self-test and over range indicator. The ADXL1001 andADXL1002 are rated for operation over a -40 to +125 degree C temperature range.
The ADCL1001 is available now in a 32-lead, 5.0 x 5.0m LFCSP. The ADXL1002 is also available now in a 32-lead LFCSP measuring 5.0 x 5.0mm.
Analog Devices bridges the physical and digital worlds with technologies that sense, measure, power, connect and interpret. In March 2017 it acquired Linear Technology.
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